A. Donmez (Co-chair, NIST, USA)

L. Deshayes (Co-chair, Univ. of Auvergne, France)

Y. Altintas (Univ. of British Columbia, Canada)

D. Brissaud (3S, Grenoble, France)

R. Ivester (NIST, USA)

T. Schmitz (Univ. of Florida, USA)

J. Soons (NIST, USA)

S. Tichkiewitch  (3S, Grenoble, France)

L. A. Welsch (NIST, USA)

T. Burns (NIST, USA)

M. Davies (Univ. of North Carolina at Charlotte, USA)

N. Du Prez (Stellenbosch, South Africa)

K. Erkorkmaz (Univ. of Waterloo, Canada)

S. Foufou (Univ. of Bourgogne, France)

B. Furet (ECN, Nantes, France)

R. Gao (Univ. of Massachusetts, USA)

D. Gilsinn (NIST, USA)

G. Gogu (IFMA, Clermont Ferrand, France)

A. Gouskov (Bauman Moscow St. Technical Univ. of Russia, Russia)

M. Gruninger (Univ. of Toronto, Canada)

R. Hocken (Univ. of North Carolina at Charlotte, USA)

K. Lee (NIST, USA)

T. Mabrouki (INSA, Lyon, France)

B. Mann (Univ. of Missouri, USA)

C. McMahon (Univ. of Bath, UK)

A.R. Mileham (Univ. of Bath, UK)

L. Monostori (Sztaki, Budapest, Hungary)

J. Ni (Univ. of Michigan, USA)

F. Potra (Univ. of Maryland, USA)

F. Proctor (NIST, USA)

J.-F. Rigal (INSA Lyon, France)

M. Shpitalni (Israel Institute of Technology, Haifa, Israel)

S. Smith (Univ. of North Carolina at Charlotte, USA)

J. Snyder (TechSolve, USA)

R. Sudarsan (George Washington Univ, USA)

X. Xu (Univ. of Auckland, New Zealand)

J. Ziegert (Univ. of Florida, USA)